{"subject":"[Guangfu] Atomic Force Microscope, VT-SPM","detailContent":"<style type=\"text/css\">.ed_pic_right img,\r\n    .ed_pic img {\r\n        max-height: 400px;\r\n    }\r\n</style>\r\n<div class=\"ed_model05 clearfix\">\r\n<div class=\"ed_pic_right\"><img alt=\"Atomic force microscope\" src=\"/userfiles/ordch/images/20231017130518284.jpg\" /></div>\r\n\r\n<ul>\r\n\t<li class=\"ed_txt\"><strong>Variable Temperature Scanning Probe Microscope (under ambient conditions or in high vacuum, at 100 &ndash; 1000 K)</strong>\r\n\r\n\t<ul>\r\n\t\t<li class=\"ed_txt\">Abbreviation: VT SPM</li>\r\n\t\t<li class=\"ed_txt\">Brand: Japan SII Nanotechnology Inc.</li>\r\n\t\t<li class=\"ed_txt\">Model: SPA-300HV</li>\r\n\t</ul>\r\n\t</li>\r\n\t<li class=\"ed_txt\"><strong>Instrument Expert: Prof.&nbsp;Jian, Wen-Bin</strong>\r\n\t<ul>\r\n\t\t<li class=\"ed_txt\">Extension 56159</li>\r\n\t</ul>\r\n\t</li>\r\n\t<li class=\"ed_txt\"><strong>Instrument Operation Technician: Chiu,&nbsp;Chih-Chia</strong>\r\n\t<ul>\r\n\t\t<li class=\"ed_txt\">Extension 56190</li>\r\n\t\t<li class=\"ed_txt\">Email: <a href=\"mailto:mailto:tg940980664.sc14@nycu.edu.tw\" title=\"tg940980664.sc14@nycu.edu.tw\">tg940980664.sc14@nycu.edu.tw</a></li>\r\n\t</ul>\r\n\t</li>\r\n\t<li class=\"ed_txt\"><strong>Instrument Location: Room 009, Science Building 3 (Department of Electrophysics</strong><strong>)</strong></li>\r\n</ul>\r\n</div>","dataClassName":null,"pubUnitName":"Instrumentation Resource Center                                                                     ","posterDate":null,"updateDate":"2026-03-16","liaisonper":null,"liaisontel":null,"liaisonfax":null,"liaisonemail":null,"languageurl":null,"page1Title":"Introduction","page1":"<div class=\"ed_model01 clearfix\">\r\n<div class=\"ed_txt\"><strong>Instrument Information</strong><br />\r\nBrand: Japan SII Nanotechnology Inc.<br />\r\nModel: SPA-300HV<br />\r\nYear of purchase: June 2004<br />\r\n<br />\r\n<strong>Important Specifications</strong><br />\r\nThis set of equipment provides scanning probe microscope functions such as AFM (atomic force microscope) and MFM (magnetic force microscope) under room temperature atmosphere.</div>\r\n\r\n<ul>\r\n\t<li class=\"ed_txt\">Purpose: Nanoscale surface morphology measurement</li>\r\n\t<li class=\"ed_txt\">Resolution: X, Y: 0.2 nm, Z: 0.01 nm (scanner: 150 um, 20 um)</li>\r\n\t<li class=\"ed_txt\">Scanning functions and probes: Contact mode atomic force microscope (AFM), Conducting contact mode atomic force microscope (C-AFM), Tapping mode atomic force microscope (DFM), Magnetic force microscope (MFM)</li>\r\n</ul>\r\n</div>","page2Title":"Service Items and Opening Hours","page2":"<div class=\"ed_model01 clearfix\">\r\n<div class=\"ed_txt\"><strong>Services</strong><br />\r\nSurface topography (atomic force microscope can reach one-nanometer resolution), surface electrical properties measurement, and surface magnetic properties measurement<br />\r\n<br />\r\n<strong>Opening Hours</strong></div>\r\n\r\n<ol>\r\n\t<li class=\"ed_txt\">Monday to Friday: 9:00 AM &ndash; 5:00 PM</li>\r\n\t<li class=\"ed_txt\">Nights, Saturdays and Sundays: Contact instrument experts or operators</li>\r\n</ol>\r\n</div>","page3Title":"System Open Level","page3":"<div class=\"ed_model01 clearfix\">\r\n<div class=\"ed_txt\"><strong>System Opening Level</strong></div>\r\n\r\n<ol>\r\n\t<li class=\"ed_txt\">General Working Hours: It is open to on-campus users and off-campus project applicants&nbsp;and can be self-operated by users or by our technicians and professionals. (Levels A and D)</li>\r\n\t<li class=\"ed_txt\">Night and Holidays: It is open to on-campus users and off-campus project applicants and must be operated by our technicians and professionals. (Level D)</li>\r\n</ol>\r\n\r\n<div class=\"ed_txt\"><strong><u>Level Description</u></strong></div>\r\n\r\n<ul>\r\n\t<li class=\"ed_txt\">Level A: Open to students who need to use it. They can operate it on their own after training and assessment.</li>\r\n\t<li class=\"ed_txt\">Level B: Each professor nominates one student for training, while the rest operate under those who have been trained. Professors with multiple students using the instrument can request an increase in the number of students receiving training.</li>\r\n\t<li class=\"ed_txt\">Level C: The instrument administrator selects several students recommended by the professor to receive training. After passing the assessment, they can self-operate the instrument and be responsible for delegated operation service.</li>\r\n\t<li class=\"ed_txt\">Level D: The laboratory&#39;s technical staff only accept delegated services and are unavailable for general use.</li>\r\n</ul>\r\n</div>","page4Title":"Charges","page4":"<div class=\"table01\">\r\n<table class=\"ed_table caption-top\" summary=\"Charge Standard\">\r\n\t<caption>Charging standards</caption>\r\n\t<tbody>\r\n\t\t<tr>\r\n\t\t\t<th style=\"text-align: left;\">unit</th>\r\n\t\t\t<th style=\"text-align: left;\">Type</th>\r\n\t\t\t<th style=\"text-align: left;\">Fee (additional fee for probes)</th>\r\n\t\t</tr>\r\n\t\t<tr>\r\n\t\t\t<td class=\"ed_pc_center\" colspan=\"1\" data-th=\"unit\" rowspan=\"2\" style=\"text-align: left;\">NYCU Department of Electrophysics</td>\r\n\t\t\t<td class=\"ed_pc_center\" data-th=\"unit\" style=\"text-align: left;\">self-operation</td>\r\n\t\t\t<td data-th=\"Fees (excluding probe)\">NT$600 /hr</td>\r\n\t\t</tr>\r\n\t\t<tr>\r\n\t\t\t<td class=\"ed_pc_center\" data-th=\"unit\" style=\"text-align: left;\">entrusted operation</td>\r\n\t\t\t<td data-th=\"Fees (excluding probe)\">NT$800 /hr</td>\r\n\t\t</tr>\r\n\t\t<tr>\r\n\t\t\t<td class=\"ed_pc_center\" colspan=\"1\" data-th=\"unit\" rowspan=\"2\" style=\"text-align: left;\">On-campus Units</td>\r\n\t\t\t<td class=\"ed_pc_center\" data-th=\"unit\" style=\"text-align: left;\">self-operation</td>\r\n\t\t\t<td data-th=\"Cost (excluding probe)\">NT$1,000 /hr</td>\r\n\t\t</tr>\r\n\t\t<tr>\r\n\t\t\t<td class=\"ed_pc_center\" data-th=\"unit\" style=\"text-align: left;\">entrusted operation</td>\r\n\t\t\t<td data-th=\"Cost (excluding probe)\">NT$1,200 /hr</td>\r\n\t\t</tr>\r\n\t\t<tr>\r\n\t\t\t<td class=\"ed_pc_center\" data-th=\"unit\" style=\"text-align: left;\">Off-campus Academic Units</td>\r\n\t\t\t<td class=\"ed_pc_center\" data-th=\"unit\" style=\"text-align: left;\">entrusted operation</td>\r\n\t\t\t<td data-th=\"Cost (excluding probe)\">NT$1,500 /hr</td>\r\n\t\t</tr>\r\n\t\t<tr>\r\n\t\t\t<td class=\"ed_pc_center\" data-th=\"unit\" style=\"text-align: left;\">Industry</td>\r\n\t\t\t<td class=\"ed_pc_center\" data-th=\"unit\" style=\"text-align: left;\">entrusted operation</td>\r\n\t\t\t<td data-th=\"Cost (excluding probe)\">NT$3,000 /hr</td>\r\n\t\t</tr>\r\n\t\t<tr>\r\n\t\t\t<td class=\"ed_pc_center\" colspan=\"2\" data-th=\"unit\" rowspan=\"1\" style=\"text-align: left;\">Probes</td>\r\n\t\t\t<td data-th=\"Cost (excluding probe)\">NT$1,200 /piece</td>\r\n\t\t</tr>\r\n\t</tbody>\r\n</table>\r\n\r\n<ul>\r\n\t<li>You can bring your own probe to meet the specifications, or buy it on-site. You need to pay for the first time to buy a new probe, and then use it or replace it as appropriate.</li>\r\n\t<li>Usage Fee : Measurement Fee*Experiment Hours+Probe Fee</li>\r\n\t<li>Laboratory hours include sample preparation and archiving.</li>\r\n</ul>\r\n</div>","page5Title":"Management and Usage Methods","page5":"<div class=\"ed_model01 clearfix\">\r\n<div class=\"ed_txt\"><strong>Management and Operation Methods:</strong><br />\r\nUsers from off-campus can use two modes: (1) Delegated Service by our technicians; (2) Apply for training. After passing the test, users can make reservations to self-operation during working hours.&nbsp;<br />\r\n<br />\r\n<strong>Instrument Training Application Instructions:</strong></div>\r\n\r\n<ol>\r\n\t<li class=\"ed_txt\">Fill in the common instrument operation application form</li>\r\n\t<li class=\"ed_txt\">Arrange training time with approval from instrument experts.</li>\r\n</ol>\r\n\r\n<div class=\"ed_txt\"><strong>Instrument Operation Reservation</strong></div>\r\n\r\n<ol>\r\n\t<li class=\"ed_txt\">Fill in the common instrument operation application form</li>\r\n\t<li class=\"ed_txt\">After the instrument expert approves, the usage time will be arranged.</li>\r\n</ol>\r\n</div>","page6Title":null,"page6":null,"page7Title":null,"page7":null,"page8Title":null,"page8":null,"docs":[],"images":[{"fileurl":"https://ord.nycu.edu.tw/ord/en/app/machine/image?module=machine&detailNo=1168810958852722688&init=Y","expFile":"Atomic Force Microscope VT-SPM"}],"videos":[],"audios":[],"resources":[{"relateURL":"https://ord.edu.tw/ord/en/app/artwebsite/view?module=artwebsite&id=2021&serno=ebdd9934-00ef-4bee-9a8a-11f305100505","relateName":"Instrument List of Guangfu and Boai Campus"},{"relateURL":"https://www.nycu.edu.tw/ord/en/app/machine/list?module=machine&id=2042","relateName":"Other Analyzers"}]}