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NYCU Office of Research and Development

Electron Microscope

[GuanFu] SEM (JSM IT-300) and EBL

  • Update Date:2024-07-17
  • Units:Instrumentation Resource Center

[GuanFu] E-beam inspection tool, eScan310

  • Update Date:2024-04-11
  • Units:Instrumentation Resource Center

[GuanFu] SEM: S-4700I

  • Update Date:2024-04-10
  • Units:Instrumentation Resource Center

[GuanFu] FE-SEM: JSM-6700F

  • Update Date:2024-04-10
  • Units:Instrumentation Resource Center

[YangMing] TEM: JEM-1400plus

  • Update Date:2024-04-10
  • Units:Instrumentation Resource Center

[YangMing] FE-SEM: JSM-7600F

  • Update Date:2024-04-10
  • Units:Instrumentation Resource Center

[YangMing] TEM: JEM-2000EX II

  • Update Date:2024-04-10
  • Units:Instrumentation Resource Center
,total 7 records GO
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