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NYCU Office of Research and Development

List of Instruments

  • Material

  • Update Date:2025-04-23
  • Units:Instrumentation Resource Center
Field Emission Transmission Electron Microscope (FE-TEM)
FIELD Emission Transmission Electron Microscope
  • Field Emission Transmission Electron Microscope (FE-TEM)
    Brand Model: JOEL, JEM-F200
  • Instrument expert: Prof. Wu, Wen-Wei
    ext 55395
  • Instrument consulting and operation services: Mr. Ou, Da-Zheng
    ext 55371
    Email tem55371@nycu.edu.tw
  • Instrument location: Room 108, Engineering Sixth Building, Guanfu Campus
Instrument brand, model, year of purchase
Brand: JEOL
Model: JEM-F200
Purchase period: five years, purchased on 2016/12/1

Important Specifications
  • Electron gun: ZrO/W(100) Schottky type
  • Maximum acceleration voltage: 200kV
  • Magnification: x50~x2M
  • Point resolution:<=0.23nm
  • Lattice resolution:<=0.1nm
  • Maximum tilt angle: +35~-35 degrees
Services
TEM: Microstructure of material specimens, defect observation of crystal structure, and selective area diffraction to determine crystal structure.

Instrument training operation application instructions
  1. Applicants must be doctoral students and have passed the JEOL2000FX TEM assessment.
  2. The order of application is based on the date of passing the JEOL2000FX TEM assessment.
  3. The training time TEM requires 6 periods. After the training, you can make an appointment with the technician to practice and take the exam.
  4. You can operate on your own after passing the assessment; before passing the assessment, you are strictly prohibited from operating on your own unless assisted by a technician or teaching assistant.
Opening schedule
  Monday Tuesday Wednesday Thursday Friday Saturday Sunday
Morning (08:30 to 12:00) Off-campus commission Off-campus commission Off-campus commission Off-campus commission Off-campus commission A license holder A Licensee
Noon (13:30 to 17:00) Training On-campus commission B license holder B license holder B license holder B license holder B license holder
Evening A license holder Machine training A Licensee A Licensee A license holder A license holder A Licensee

System opening level
Level A: You can reserve a time to operate by yourself. Doctoral students who have passed the JEOL2000FX assessment can apply for training and obtain A-level qualifications after passing the license assessment.
Level D: Commissioned service, operated by technicians. Please refer to the ”Opening Timetable”
for the entrustment period.
System opening level description
  • Level A: Open to students who need to use it. They can operate it on their own after training and assessment.
  • Level B: Each professor assigns one student to apply for training. The other students of the professor need to be operated by students who have received training. If a professor has too many students using the instrument, he or she can ask the instrument to The person in charge applied to increase the number of students receiving training.
  • Level C: The person in charge of the instrument selects a number of students recommended by the professor to receive training. After passing the assessment, they can operate the instrument themselves and be responsible for entrusted service work.
  • Level D: The technical staff of this laboratory accept entrusted services and are not open for use.
Charging standard (unit: NTD)
  • TEM
  • reservations with NSTC project
    • Entrusted operation: $4,000/time
    • Self-guided operation: $2,000/time
    • Photography: $15/picture
    • EDS: $75/point, $100/line, $150/plane
  • reservations without NSTC project
    • Entrusted operation: $20,000/time
    • Self-guided operation: $15,000/time
    • Photography: $150/picture
    • EDS: $150/point, $200/line, $300/plane
Management and usage instructions
  1. This laboratory is not a TEM specimen production unit. Please prepare observable TEM specimens for experiments. The test piece needs to be prepared by yourself, with a diameter of 3mm and a thickness of less than 300nm.
  2. The sample to be tested should be a solid material and should have appropriate and sufficient mechanical strength to avoid peeling and fragmentation during the operation of entering and exiting the electron microscope or during the detection operation, and will not be accepted.
  3. Materials with low melting points such as indium and tin will produce phase changes and evaporation effects and will not be accepted.
  4. Samples that will decompose or release gas under electron beam irradiation and interfere with vacuum, such as organic matter, polymer, biological or ferromagnetic powder samples, etc., will not be accepted.
  5. Powder form samples or materials that are highly magnetic, magnetic, or easily attracted to electromagnetic lenses, such as iron, cobalt, nickel, etc. powders, will not be accepted.
  6. Radioactive or toxic samples will not be accepted.
  7. All samples dripped with aqueous solutions onto copper grids need to be fully dried to remove moisture; after the samples are sent to our laboratory, they still need to be baked again by our laboratory staff for ten minutes before they can be served. machine. If the test piece is filled with water vapor and causes contamination of the machine, the reservation unit will need to jointly bear the cost of machine maintenance.
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