Basic Service-Physics-Spherical Aberration Corrected Scanning Transmission Electron Microscope Cs-corrected STEM-NYCU Office of Research and Development

Basic Service-Physics

中文

Update Date：2025-03-25
Units：Instrumentation Resource Center

Spherical Aberration Corrected Scanning Transmission Electron Microscope Cs-corrected STEM

Spherical Aberration Corrected Scanning Transmission Electron Microscope
English abbreviation: Cs-corrected STEM
Brand model: JEOL ARM200F
Instrument expert: Prof. Chang Li
Ext 31615
Instrument expert: Prof. Jian, Wen-Bin
ext 56159
Instrument expert: Prof. Chen, Chih-Yen
ext 56118
Instrument consultation and operation services: Dr. Lim
ext 56156
Email nctu.arm200f@gmail.com
Instrument location: Room SC022, B1, Science Building 3, Guanfu Campus

Instrument Information
Purchase Date: December 2011
Service Start Date: June 2012
Funding source: National Science Association, Ministry of Education, National Yang Ming Chiao Tung University

Instrument Important Specifications

Accelerating voltage: 200 kV
Electron Gun System: Schottky Field Emission Gun (FEG)
Resolution (200kV):
- TEM Lattice resolution: 0.072 nm
- TEM Point resolution: 0.190 nm
- TEM Optical information limit: 0.107 nm
- HRTEM mode (UHR pole piece, Cs = 0.5 mm, Cc = 1.1 mm)
- STEM BF image resolution: 0.136 nm
- STEM HAADF image resolution: 0.082 nm
- STEM aberration free area angle: 36.63 mrad
The tilt angle of the double-inclined test piece holder: plus or minus 25 degrees.
STEM spherical aberration corrector (Spherical aberration Corrector).
STEM BF/HAADF detector (High Angle Annual Dark Field Detector).
X-ray Energy Dispersion Analyzer (EDS) : Si drift detector (SDD), Energy resolution 127eV.

service items
TEM bright field image (Bright Field), high resolution image (HRTEM), STEM image (ABF/HAADF); does not provide storage of direct selective area diffraction pattern (SAD), but can store the diffraction pattern converted by software processing. Nanoscale X-ray EDS Spectroscopy (B5~U92), STEM contains EDS Point ID/Line Scan/Mapping.

Instrument reservation method

Please make an appointment National Science Council Basic Research Core Facility Reservation Service Management System reserve
On the 20th of each month, TEM appointments for the following month will be opened. The appointment application form will be returned within 5 days of the appointment. If the appointment application form is not returned, the appointment will be regarded as incomplete, and the unit has the right to cancel the time slot.
If you want to cancel the appointment, please cancel online on your own five days in advance. Those who do not arrive for the experiment on the same day and do not notify by phone will be considered as a no-show, and the three-hour fee of the original appointment will still be deducted during this time period.
If you want to cancel the appointment but it has been less than five days (excluding the day of the experiment), and you cannot cancel it yourself, please call or write to inform you first, and the one-hour basic fee will still be deducted during this period.
Please take a photo or scan and send it to the technician's mailbox nctu.arm200f@gmail.com

Opening hours
Opening hours (Applicable from May 2017)	morning	afternoon	night
Monday	09:00 – 12:00 Delegate operation	13:30 – 16:30 Delegate operation	18:00 – 21:00 Do it yourself
Tuesday	09:00 – 12:00 Delegate operation	13:30 – 16:30 Delegate operation	18:00 – 21:00 Do it yourself
Wednesday	09:00 – 12:00 Delegate operation	13:30 – 16:30 Delegate operation	18:00 – 21:00 Do it yourself
Thursday	09:00 – 12:00 Delegate operation	13:30 – 16:30 Delegate operation	18:00 – 21:00 Do it yourself
Friday	09:00 – 12:00 Do it yourself	13:30 – 16:30 Do it yourself	18:00 – 21:00 Do it yourself
Saturday	09:00 – 12:00 Do it yourself	13:30 – 16:30 Do it yourself	18:00 – 21:00 Do it yourself
Sunday	09:00 – 12:00 Do it yourself	13:30 – 16:30 Do it yourself	18:00 – 21:00 Do it yourself

System open level

Class A. Entrusted service, operated by technicians of this laboratory.
Grade B. The person in charge of the instrument selects a number of students recommended by the professor to receive training. They must first pass the electron microscopy course of the institute. After passing the examination, they can operate the instrument by themselves and be responsible for the entrusted service work.
Grade C. Each professor/laboratory is limited to one student in the doctoral class below the third grade, who must first pass the electron microscopy course of the Institute, and must have the qualification to use the JEOL-2100F assessment of the Nanotechnology Center of Jiaotong University before applying undergo training. The training time is 20 periods. The passing standard of the assessment is that the resolution of STEM is 0.08nm. The training fee is charged according to the commissioned operation fee standard. Before passing the examination, it is strictly forbidden to operate by yourself, except for the assistance of technicians or teaching assistants; after passing the license examination and obtaining the C-level qualification, you can operate by yourself.

Charges

TEM/STEM/EDS (specimen mounting, vacuum extraction, electron optical calibration, file transfer are also covered in the session)
1. Entrusted operation: NT$1,920 per time slot. Each time slot is counted as three hours. If it is less than one time period, it will be charged as one time slot. NT$640 will be charged for more than one hour. The entrusted operation of the industry unit is charged according to the above entrusted time period, NT$19,200 / time period.
2. Self-operation: NT$750 per time slot, each time slot is counted as three hours, and those that are less than one time period are also counted as one time slot, and NT$250 will be charged for more than one hour.
3. The processing fee for each TEM image file and EDS file is NT$15. (This instrument has no negative film access device) To avoid equipment poisoning, data transmission with flash drives is prohibited; please prepare a burnable blank CD to store data (VCD/DVD are both acceptable).

Management methods and test strip restrictions

This laboratory is not a TEM test piece production unit, please prepare observable TEM test pieces for experiments.
The sample to be tested should be a solid material and should have appropriate and sufficient mechanical strength to avoid peeling and chipping during the process of entering and exiting the electron microscope or during the inspection process, which will not be accepted.
Materials with low melting point such as indium, tin, etc. will cause phase transition and evaporation effect, and will not be accepted.
Samples that will decompose or release gas under electron beam irradiation and hinder the vacuum, such as organic matter, polymer, biological or ferromagnetic powder samples, etc., will not be accepted.
Samples or materials in powder form with strong magnetism, magnetism, or easily attracted by electromagnetic lenses, such as iron, cobalt, nickel, etc., will not be accepted.
Radioactive or toxic samples will not be accepted.
In-situ and heated testing services will not be accepted.
All samples dropped on the copper mesh with aqueous solution need to be fully dried to remove moisture; after the samples are sent to the laboratory, they still need to be baked again by the laboratory staff for ten minutes before they can be used on the machine. If the test piece is full of water vapor and the machine is polluted, the reservation unit needs to jointly pay for the maintenance cost of the machine.
If the sample to be tested cannot obtain the specified resolution due to cleanliness or other non-microscopic factors, the above-mentioned charging standard will still be charged. [STEM < 0.1 nm resolution requires longer set-up time, and the sample needs to have an appropriate area and be beam showering]
Before entrusting the operator to get on the machine, the unit will ask again to confirm the type of samples sent for testing, and the entrusting party should declare honestly. If the declaration is found to be false, the unit will cancel the appointment qualifications of all the laboratories it belongs to for six months. If the instrument is polluted or damaged due to violation of the above regulations, the affiliated unit and its instructor shall be responsible for compensation. The compensation fee will be assessed by the original factory, and then implemented by the management committee and suspended the right to use the instrument.
Persons with self-operating qualifications who use the CCD to directly shoot diffraction patterns or put the above-mentioned harmful samples into the instrument without authorization will be subject to aggravated punishment and their operating qualifications will be revoked for one year. If the instrument is polluted or damaged due to violation of the above regulations, the affiliated unit and its instructor shall be responsible for compensation. The compensation fee will be assessed by the original factory, and then implemented by the management committee and suspended the right to use the instrument.